PHI products

PHI710 Scanning Auger Nanoprobe

The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy (AES) instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces.

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PHI nanoTOF II

Time-of-Flight Secondary Ion Mass Spectrometer with Parallel Imaging MS/MS for Confident Molecular Identification

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PHI Genesis

Fully automated multi-tech XPS / HAXPES Model 500 for XPS / Model 900 for HAXPES

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PHI VersaProbe III Scanning XPS Microprobe

X-Ray Photoelectron Spectroscopy (XPS/ESCA) is the most widely used surface analysis technique and has many well-being established industrial and research applications.

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PHI X-tool Automated XPS Microprobe

The electron gun projects a focused raster scanned electron beam on to the aluminum (Al) anode generating a point source of Al x-rays. The ellipsoidal shaped quartz crystal monochromator refocuses the x-raybeam onto the sample.

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